Title :
Thermal design and measurements of IGBT power modules: transient and steady state
Author :
He, Jun ; Mehrotra, Vivek ; Shaw, Michael C.
Author_Institution :
Dept. of Design & Reliability, Rockwell Sci. Centre, Thousand Oaks, CA, USA
Abstract :
The spatial temperature distributions on IGBT devices in 6-pack power modules have been measured during both transient and steady-states using ultra high speed infrared microscopy. Power modules examined included a commercial 6-pack module and a miniaturized inverter. The modules were constructed using both Al2O3 and AlN direct bond copper (DBC) substrates and an insulated metal substrate (IMS). The effects of IGBT bonding pad design and layout, bond wire arrangement and module curvature on the temperature distribution were measured and analyzed. Thermal performances of all the modules were characterized by the junction-to-case, case-to-sink and sink-to-ambient thermal resistance. The trade-offs between AlN, Al2O3 , and IMS substrates and the replacement of conventional solder with a conductive adhesive are discussed from thermal, reliability and cost viewpoints
Keywords :
adhesives; insulated gate bipolar transistors; invertors; modules; substrates; temperature distribution; thermal resistance measurement; Al2O3; AlN; Cu; IGBT bonding pad design; IGBT devices; IGBT power modules; bond wire arrangement; case-to-sink thermal resistance; conductive adhesive; cost; direct bond copper substrates; insulated metal substrate; junction-to-case thermal resistance; layout; miniaturized inverter; module curvature; power modules; reliability; sink-to-ambient thermal resistance; spatial temperature distributions; temperature distribution; thermal design; thermal performances; thermal resistance measurements; ultra high speed infrared microscopy; Bonding; Insulated gate bipolar transistors; Inverters; Microscopy; Multichip modules; Power measurement; Steady-state; Temperature distribution; Thermal resistance; Velocity measurement;
Conference_Titel :
Industry Applications Conference, 1999. Thirty-Fourth IAS Annual Meeting. Conference Record of the 1999 IEEE
Conference_Location :
Phoenix, AZ
Print_ISBN :
0-7803-5589-X
DOI :
10.1109/IAS.1999.801689