DocumentCode
3277559
Title
Experimental analysis of substrate isolation techniques for RF-SOC integration
Author
Molina, Marc ; Aragones, Xavier ; Gonzalez, J.L.
Author_Institution
Electron. Eng. Dept., Univ. Politec. de Catalunya (UPC), Barcelona, Spain
fYear
2009
fDate
9-11 Sept. 2009
Firstpage
199
Lastpage
202
Abstract
Experimental measurements of the isolation provided by N and P-type rings, and triple-well structures implemented in 0.35 ¿m and 0.18 ¿m technologies are presented. The results obtained are compared to previous experimental works on isolation, and the conditions that affect the efficacy of the isolation techniques are discussed, as well as their dependence with frequency.
Keywords
integrated circuit design; radiofrequency integrated circuits; system-on-chip; N--type rings; P-type rings; RF-SOC integration; substrate isolation techniques; triple-well structures; wavelength 0.18 mum; wavelength 0.35 mum; CMOS technology; Circuit noise; Conductivity; Coupling circuits; Dielectric substrates; Isolation technology; Probes; Radio frequency; Testing; Wireless communication;
fLanguage
English
Publisher
ieee
Conference_Titel
SOC Conference, 2009. SOCC 2009. IEEE International
Conference_Location
Belfast
Print_ISBN
978-1-4244-4940-8
Electronic_ISBN
978-1-4244-4941-5
Type
conf
DOI
10.1109/SOCCON.2009.5398059
Filename
5398059
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