DocumentCode
3277633
Title
Correlating op-amp circuit noise with device flicker (1/f) noise for analog design applications
Author
Srinivasan, P. ; Marshall, A.
Author_Institution
Texas Instrum., Technol. Design Integration, Dallas, TX, USA
fYear
2009
fDate
9-11 Sept. 2009
Firstpage
191
Lastpage
194
Abstract
Component noise is becoming more of an issue as device sizes reduce. Using a 45 nm CMOS process we evaluate a method to correlate noise in operational amplifiers with transistor noise at low-frequencies. This reduces test time, and provides an alternative method to characterize and model 1/f noise of individual devices.
Keywords
1/f noise; CMOS analogue integrated circuits; flicker noise; integrated circuit design; operational amplifiers; 1/f noise; CMOS process; analog design; flicker noise; operational amplifiers; transistor noise; 1f noise; Active noise reduction; Circuit noise; Low-frequency noise; Noise figure; Noise level; Noise measurement; Operational amplifiers; Semiconductor device noise; Working environment noise;
fLanguage
English
Publisher
ieee
Conference_Titel
SOC Conference, 2009. SOCC 2009. IEEE International
Conference_Location
Belfast
Print_ISBN
978-1-4244-4940-8
Electronic_ISBN
978-1-4244-4941-5
Type
conf
DOI
10.1109/SOCCON.2009.5398062
Filename
5398062
Link To Document