• DocumentCode
    3277712
  • Title

    Implementing compact thermal models under non-symmetric trace routing conditions

  • Author

    Galloway, Jesse ; Shidore, Sarang

  • Author_Institution
    Amkor Technol., Chandler, AZ, USA
  • fYear
    2004
  • fDate
    9-11 Mar 2004
  • Firstpage
    255
  • Lastpage
    261
  • Abstract
    Compact thermal models (CTMs) are used to reduce the size and time required to solve system thermal models while still maintaining a high level of simulation accuracy. Methods for developing and validating CTMs under symmetrical boundary conditions are well understood. However, they do no always accurately predict the thermal solution for nonsymmetrical boundary conditions arising from either developing flow and/or non-uniform trace routing conditions. Presented in this study is a detailed analysis of a super ball grid array (SBGA) and a carrier array ball grid array (CABGA) style packages. Also presented are two-resistor models, symmetric and non-symmetric compact models. Two-resistor models were shown to underestimate the thermal resistance while Delphi style compact models tend to overestimate the thermal resistances for the SBGA and CABGA packages considered in this study. A method of accounting for non-symmetrical printed circuit board (PCB) routing conditions is also presented.
  • Keywords
    ball grid arrays; heat transfer; semiconductor device models; thermal management (packaging); thermal resistance; Delphi style compact models; carrier array ball grid array; compact thermal models; nonsymmetric trace routing conditions; simulation accuracy; super ball grid array; symmetric compact models; thermal resistances; two-resistor models; Anisotropic magnetoresistance; Boundary conditions; Conductivity measurement; Electronic packaging thermal management; Electronics packaging; Printed circuits; Routing; Testing; Thermal conductivity; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 2004. Twentieth Annual IEEE
  • ISSN
    1065-2221
  • Print_ISBN
    0-7803-8363-X
  • Type

    conf

  • DOI
    10.1109/STHERM.2004.1291332
  • Filename
    1320483