• DocumentCode
    3277798
  • Title

    New correlations between electrical current and temperature rise in PCB traces

  • Author

    Adam, Johannes

  • Author_Institution
    Flomerics Ltd, Filderstadt, Germany
  • fYear
    2004
  • fDate
    9-11 Mar 2004
  • Firstpage
    292
  • Lastpage
    299
  • Abstract
    The widely used design rule IPC-2221 (=MIL-STD-275) for the ´current carrying capacity´ of traces on printed circuit boards is subject of a closer investigation. These historical studies on correlations between electrical current and temperature rise of the trace can be reproduced by numerical heat transfer simulations only if the board has a back 35μm copper layer and the thickness of the trace is 35 μm. As this makes an. extrapolation to other boards impossible, we will present numerical studies for FR4-based board models with other copper planes and also for ceramic substrates. For a better understanding of the results, 2D heat conduction calculations for traces on boards with constant internal and external conditions are performed. Quantitatively, they can be interpreted as parallel thermal resistances of the trace and the rest of the board, where we treat the board approximately as a heat sink fin. These semi-analytic limits give scaling laws for the thermal resistance of the trace as function of board conductivity, heat exchange coefficient, board thickness and trace width. For the more realistic board models this simplified theory is not powerful enough as the thermal isolation between trace and first copper plane is not included.
  • Keywords
    cooling; printed circuits; thermal management (packaging); thermal resistance; Cu planes; FR4-based board models; PCB traces; ceramic substrates; electrical current; heat conduction calculations; numerical heat transfer simulations; parallel thermal resistances; printed circuit boards; temperature rise; Circuit simulation; Copper; Extrapolation; Heat transfer; Numerical simulation; Printed circuits; Resistance heating; Temperature; Thermal conductivity; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 2004. Twentieth Annual IEEE
  • ISSN
    1065-2221
  • Print_ISBN
    0-7803-8363-X
  • Type

    conf

  • DOI
    10.1109/STHERM.2004.1291337
  • Filename
    1320488