• DocumentCode
    3277872
  • Title

    The use of Electron Paramagnetic Resonance (EPR) in the probing of the nanodielectric interface

  • Author

    MacCrone, Robert K. ; Nelson, J. Keith ; Schadler, Linda S. ; Smith, Robert ; Keefe, Robert J.

  • Author_Institution
    Rensselaer Polytechnic Institute, Troy, NY 12180-3590, USA
  • fYear
    2007
  • fDate
    8-13 July 2007
  • Firstpage
    428
  • Lastpage
    431
  • Abstract
    EPR (sometimes annotated as ESR) has been carried out on functionalized nanoscale silica embedded in crosslinked polyethylene (XLPE) in comparison with the base resin. In situ EPR measurements under an applied electric field have been carried out, and the technique is outlined. The preliminary measurements show that EPR can detect trap sites in the bulk and interfacial polymer. In addition, EPR can detect texture in the polymer due to its processing. At the same time, measurements to determine the dynamics and spatial distribution of the space charge have been carried out under similar conditions using the pulsed electro-acoustic analysis technique. The results are discussed in terms of the way in which the nanoparticles affect the local polymer environment.
  • Keywords
    Charge measurement; Current measurement; Electric variables measurement; Electrons; Paramagnetic resonance; Polyethylene; Polymers; Pulse measurements; Resins; Silicon compounds;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid Dielectrics, 2007. ICSD '07. IEEE International Conference on
  • Conference_Location
    Winchester, UK
  • Print_ISBN
    1-4244-0750-8
  • Electronic_ISBN
    1-4244-0751-6
  • Type

    conf

  • DOI
    10.1109/ICSD.2007.4290843
  • Filename
    4290843