DocumentCode
3277872
Title
The use of Electron Paramagnetic Resonance (EPR) in the probing of the nanodielectric interface
Author
MacCrone, Robert K. ; Nelson, J. Keith ; Schadler, Linda S. ; Smith, Robert ; Keefe, Robert J.
Author_Institution
Rensselaer Polytechnic Institute, Troy, NY 12180-3590, USA
fYear
2007
fDate
8-13 July 2007
Firstpage
428
Lastpage
431
Abstract
EPR (sometimes annotated as ESR) has been carried out on functionalized nanoscale silica embedded in crosslinked polyethylene (XLPE) in comparison with the base resin. In situ EPR measurements under an applied electric field have been carried out, and the technique is outlined. The preliminary measurements show that EPR can detect trap sites in the bulk and interfacial polymer. In addition, EPR can detect texture in the polymer due to its processing. At the same time, measurements to determine the dynamics and spatial distribution of the space charge have been carried out under similar conditions using the pulsed electro-acoustic analysis technique. The results are discussed in terms of the way in which the nanoparticles affect the local polymer environment.
Keywords
Charge measurement; Current measurement; Electric variables measurement; Electrons; Paramagnetic resonance; Polyethylene; Polymers; Pulse measurements; Resins; Silicon compounds;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid Dielectrics, 2007. ICSD '07. IEEE International Conference on
Conference_Location
Winchester, UK
Print_ISBN
1-4244-0750-8
Electronic_ISBN
1-4244-0751-6
Type
conf
DOI
10.1109/ICSD.2007.4290843
Filename
4290843
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