• DocumentCode
    3277907
  • Title

    Fractal Network Diffusicm of Fluorine and Boron in Polysilicon Gates

  • Author

    Orlowski, Marius ; Tseng, Hsing-Huang ; Hance, Robert ; Tobin, Philip J.

  • Author_Institution
    Motorola, Inc.
  • fYear
    1992
  • fDate
    31 May-1 Jun 1992
  • Firstpage
    35
  • Lastpage
    40
  • Keywords
    Annealing; Boron; Equations; Fractals; Grain boundaries; Inorganic materials; Intelligent networks; MOSFET circuits; Silicon; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Numerical Modeling of Processes and Devices for Integrated Circuits, 1992. NUPAD IV. Workshop on
  • Print_ISBN
    0-7803-0516-7
  • Type

    conf

  • DOI
    10.1109/NUPAD.1992.673843
  • Filename
    673843