• DocumentCode
    3278861
  • Title

    A novel open Automatic Test System based on SI and SCMM technology

  • Author

    He, Ling ; Yu, Juebang

  • Author_Institution
    Inst. of Astronaut. & Aeronaut., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • fYear
    2011
  • fDate
    15-17 April 2011
  • Firstpage
    78
  • Lastpage
    82
  • Abstract
    Aiming at effectively addressing the dedicated testing application issues of special-purpose communication devices, this paper devotes to some research on integrated stimulating, analyzing and testing technologies for electronic communication systems and the signals to or from the systems. An open ATS (Automatic Test System) architecture based on related technologies as SI (Synthetic Instruments) and SCMM (Single Connection Multiple Measurement) is proposed firstly, and the system structure is studied. Several practical test applications are then introduced to prove that given a uniform system platform, a variety of test functions, such as stimulating signals generation, test procedures control and analysis, can be achieved by various system configurations; and the purpose of integrated testing and verification for terminals in communication and navigation systems should be attained consequently.
  • Keywords
    automatic testing; signal generators; SCMM technology; SI technology; communication systems; dedicated testing application issue; electronic communication system; navigation systems; open automatic test system; signals generation; single connection multiple measurement; special purpose communication device; synthetic instrument; test procedures control; Computer architecture; Digital signal processing; Global Navigation Satellite Systems; Instruments; Receivers; Silicon; Testing; ATS; SCMM; SI; communication and navigation terminals; integrated testing and verification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electric Information and Control Engineering (ICEICE), 2011 International Conference on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-8036-4
  • Type

    conf

  • DOI
    10.1109/ICEICE.2011.5777545
  • Filename
    5777545