• DocumentCode
    327947
  • Title

    Cellular Scan Revisited

  • Author

    Gloster, Clay, Jr. ; Brglez, Franc

  • Author_Institution
    NCSU/MCNC Center for Microelectronics, N.C.
  • fYear
    1992
  • fDate
    1-3 Mar 1992
  • Firstpage
    246
  • Lastpage
    250
  • Keywords
    Circuit faults; Circuit testing; Clocks; Costs; Hardware; Integrated circuit testing; Latches; Microelectronics; Sequential analysis; Sequential circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    System Theory, 1992. Proceedings. SSST/CSA 92. The 24th Southeastern Symposium on and The 3rd Annual Symposium on Communications, Signal Processing Expert Systems, and ASIC VLSI Design
  • ISSN
    0094-2898
  • Print_ISBN
    0-8186-2665-8
  • Type

    conf

  • DOI
    10.1109/SSST.1992.712271
  • Filename
    712271
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=327947