Quasi-optical measurements of magnetic materials at frequencies up to 630 GHz

Author

Yang, Bin ; Martin, Derek H. ; Donnan, Robert S. ; Wylde, Richard J.

Author_Institution

Dept. of Electron. Eng., Queen Mary Univ. of London, London

fYear

2008

fDate

15-19 Sept. 2008

Firstpage

1

Lastpage

2

Abstract

This paper investigates complex refractive index and wave-impedance of commercial permanent-magnet hexaferrites, which are suitable for use in quasi-optical nonreciprocal devices at millimeter and submillimeter wave frequencies. The measurements are realized by using broadband quasi-optical bench and vector network analyzer in the frequency range 75-630 GHz.

Keywords

ferrites; permanent magnets; refractive index; submillimetre wave devices; commercial permanent-magnet hexaferrites; frequency 75 GHz to 630 GHz; magnetic materials; millimeter wave frequencies; quasioptical measurements; quasioptical nonreciprocal devices; refractive index; submillimeter wave frequencies; vector network analyzer; wave-impedance; Dielectric measurements; Ferrites; Frequency estimation; Frequency measurement; Magnetic analysis; Magnetic field measurement; Magnetic materials; Magnetooptic devices; Refractive index; Silicon;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared, Millimeter and Terahertz Waves, 2008. IRMMW-THz 2008. 33rd International Conference on

Conference_Location

Pasadena, CA

Print_ISBN

978-1-4244-2119-0

Electronic_ISBN

978-1-4244-2120-6

Type

conf

DOI

10.1109/ICIMW.2008.4665774

Filename

4665774