DocumentCode :
3279827
Title :
A tunable and program-erasable capacitor on Si with excellent tuning memory
Author :
Lai, C.H. ; Lee, C.F. ; Chin, Albert ; Zhu, C. ; Li, M.-F. ; McAlister, S.P. ; Kwong, D.L.
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
fYear :
2004
fDate :
6-8 June 2004
Firstpage :
259
Lastpage :
262
Abstract :
A novel tunable and program-erasable high-κ AlN MIS capacitor is demonstrated for the first time with excellent tuning memory, which is useful to tune the impedance mismatching and resonance frequency without always having a connected voltage bias circuit. A large Cmax/Cmin tunability of 12 is obtained due to the high-κ AlN dielectric with high 5 μF/μm2 capacitance density. Good tuning memory is evidenced from the small Vth variation after program or erase at +4 V or -4 V for 10,000 s and the potential of years long extrapolated memory time.
Keywords :
III-V semiconductors; MIS capacitors; aluminium compounds; circuit resonance; circuit tuning; dielectric thin films; impedance matching; programmable circuits; wide band gap semiconductors; -4 V; 10000 s; 4 V; AlN-Si; charge trapping; high capacitance density; high-k MIS capacitor; impedance mismatch; program-erasable capacitor; resonance frequency; tunable capacitor; tuning memory; Capacitors; Circuit optimization; Impedance; RLC circuits; Resonance; Resonant frequency; Tunable circuits and devices; Tuned circuits; Tuning; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio Frequency Integrated Circuits (RFIC) Symposium, 2004. Digest of Papers. 2004 IEEE
ISSN :
1529-2517
Print_ISBN :
0-7803-8333-8
Type :
conf
DOI :
10.1109/RFIC.2004.1320589
Filename :
1320589
Link To Document :
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