• DocumentCode
    3279841
  • Title

    Study on the method of selecting test nodes based on ambiguity entropy

  • Author

    Du Minjie ; Cai Jinyan ; Chen Peng ; Zhu Sai

  • Author_Institution
    Opt. & Electron. Eng. Dept., Ordnance Eng. Coll., Shijiazhuang, China
  • fYear
    2011
  • fDate
    15-17 April 2011
  • Firstpage
    6173
  • Lastpage
    6175
  • Abstract
    The issue of test node selection for the fault diagnosis of analog circuit is studied in this paper. The formula of computing the ambiguity entropy of the test node is defined and a new algorithm of selecting test node based on the ambiguity entropy is presented. The practical application proves that the algorithm can cut the test node to the bone and enhances the correctness and real time of fault diagnosis.
  • Keywords
    analogue circuits; circuit testing; entropy; fault diagnosis; ambiguity entropy; analog circuit; fault diagnosis; selecting test nodes; Analog circuits; Circuit faults; Computer aided instruction; Dictionaries; Entropy; Fault diagnosis; Real time systems; ambiguity entropy; analog circuit; fault diagnosis; test node selection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electric Information and Control Engineering (ICEICE), 2011 International Conference on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-8036-4
  • Type

    conf

  • DOI
    10.1109/ICEICE.2011.5777590
  • Filename
    5777590
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3279841