• DocumentCode
    3279919
  • Title

    Dual-bottom-electrode CMUT based on standard CMOS process

  • Author

    Yu, Ting ; Lu, Xingqiang ; Yu, Fengqi

  • Author_Institution
    Dept. of Integrated Electron., Chinese Acad. of Sci., Shenzhen, China
  • fYear
    2011
  • fDate
    20-23 Feb. 2011
  • Firstpage
    21
  • Lastpage
    24
  • Abstract
    A novel capacitive micromachined ultrasonic transducer (CMUT) with dual-bottom-electrode based on standard CMOS and post-CMOS processes is presented. Compared to the traditional CMUT with single-bottom-electrode, the presented one has larger equivalent gap in emission and smaller air gap in reception for the membrane is biased much closer to the bottom electrode. A structure model is proposed for the presented CMUT and finite element analysis (FEA) is carried out by commercial software ANSYS. Based on the simulation results, it is shown a 5.655dB improvement in maximum output pressure at 914 kHz without collapse, and a 9.3% improvement in maximum receive sensitivity for the presented CMUT compared with the traditional structure.
  • Keywords
    CMOS integrated circuits; capacitive sensors; finite element analysis; ultrasonic transducers; capacitive micromachined ultrasonic transducer; commercial software ANSYS; dual-bottom-electrode; finite element analysis; frequency 914 kHz; maximum receive sensitivity; post-CMOS processes; single-bottom-electrode; standard CMOS processes; structure model; Acoustics; Capacitance; Electrodes; Fabrication; Finite element methods; Sensitivity; Transient analysis; CMOS; CMUT; MEMS;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems (NEMS), 2011 IEEE International Conference on
  • Conference_Location
    Kaohsiung
  • Print_ISBN
    978-1-61284-775-7
  • Type

    conf

  • DOI
    10.1109/NEMS.2011.6017285
  • Filename
    6017285