DocumentCode
3279919
Title
Dual-bottom-electrode CMUT based on standard CMOS process
Author
Yu, Ting ; Lu, Xingqiang ; Yu, Fengqi
Author_Institution
Dept. of Integrated Electron., Chinese Acad. of Sci., Shenzhen, China
fYear
2011
fDate
20-23 Feb. 2011
Firstpage
21
Lastpage
24
Abstract
A novel capacitive micromachined ultrasonic transducer (CMUT) with dual-bottom-electrode based on standard CMOS and post-CMOS processes is presented. Compared to the traditional CMUT with single-bottom-electrode, the presented one has larger equivalent gap in emission and smaller air gap in reception for the membrane is biased much closer to the bottom electrode. A structure model is proposed for the presented CMUT and finite element analysis (FEA) is carried out by commercial software ANSYS. Based on the simulation results, it is shown a 5.655dB improvement in maximum output pressure at 914 kHz without collapse, and a 9.3% improvement in maximum receive sensitivity for the presented CMUT compared with the traditional structure.
Keywords
CMOS integrated circuits; capacitive sensors; finite element analysis; ultrasonic transducers; capacitive micromachined ultrasonic transducer; commercial software ANSYS; dual-bottom-electrode; finite element analysis; frequency 914 kHz; maximum receive sensitivity; post-CMOS processes; single-bottom-electrode; standard CMOS processes; structure model; Acoustics; Capacitance; Electrodes; Fabrication; Finite element methods; Sensitivity; Transient analysis; CMOS; CMUT; MEMS;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems (NEMS), 2011 IEEE International Conference on
Conference_Location
Kaohsiung
Print_ISBN
978-1-61284-775-7
Type
conf
DOI
10.1109/NEMS.2011.6017285
Filename
6017285
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