• DocumentCode
    3280031
  • Title

    Integration of clamped-clamped suspended single-walled carbon nanotubes into SOI MEMS

  • Author

    Lee, Shih-Wei ; Muoth, Matthias ; Durrer, Lukas ; Roman, Cosmin ; Hierold, Christofer

  • Author_Institution
    Dept. of Mech. & Process Eng., ETH Zurich, Zurich, Switzerland
  • fYear
    2011
  • fDate
    20-23 Feb. 2011
  • Firstpage
    37
  • Lastpage
    40
  • Abstract
    Processes aiming at integrating suspended single-walled carbon nanotubes (SWNTs) into Micro-Electromechanical Systems (MEMS) have to deal explicitly with the fragility of SWNTs. In general, SWNT growth is delayed to the last step of a process so as to avoid any contamination and physical damage, which restricts the flexibility of an integration process. Here, we present a novel integration process involving a sacrificial bridge structure that provides SWNTs with physical support throughout the process. Thus, post-growth wet processes are enabled, and mechanical rupturing is prevented. With this novel approach, clamped-clamped suspended SWNTs with resistances down to 115 kΩ (with 2 μm suspended segment) are integrated into SOI micro-structures.
  • Keywords
    carbon nanotubes; micromechanical devices; semiconductor device metallisation; semiconductor growth; silicon-on-insulator; surface contamination; SOI MEMS; SOI microstructures; SWNT growth; clamped-clamped suspended SWNT; clamped-clamped suspended single-walled carbon nanotubes; contamination; integration process; mechanical rupturing; metallization; microelectromechanical systems; physical damage; physical support; post-growth wet processes; sacrificial bridge structure; suspended segment; Bridges; Carbon nanotubes; Electron tubes; Metals; Silicon; Surface treatment; MEMS; SWNTs; clamping; contacts; integration; suspended; top metallization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems (NEMS), 2011 IEEE International Conference on
  • Conference_Location
    Kaohsiung
  • Print_ISBN
    978-1-61284-775-7
  • Type

    conf

  • DOI
    10.1109/NEMS.2011.6017289
  • Filename
    6017289