Title :
A fully integrated 39.8-/43-GHz VCO - featuring wide tuning range and low temperature drift - for single-chip MUX/DEMUX LSIs
Author :
Nakamura, T. ; Masuda, Tom ; Ohhata, Ken-ichi ; Watanabe, Keiki ; Yoshioka, Hiroyuki ; Kusunoki, Takeshi ; Tanabe, Masamichi ; Koyama, Akio ; Harada, Takashi ; Washio, Katsuyoshi
Author_Institution :
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
Abstract :
A fully integrated 39.8-/43-GHz switchable VCO was developed for practical single-chip MUX/DEMUX LSIs in 0.18 μm SiGe BiCMOS technology . The VCO provides a clock signal for data rates of 39.8 and 43.0 Gbps. The VCO has a novel configuration of a half-frequency VCO and a frequency doubler to realize a 7 GHz tuning range, for tolerating process deviation and supporting dual mode operation. A new temperature compensation technique resulted in a 0.6% temperature fluctuation of oscillation frequency. Measured phase noise at a 1 MHz offset frequency was -85.0 dBc/Hz. Data transmission experiments between the MUX and DEMUX confirmed that this phase noise is allowable for use in 40-Gbps class network systems.
Keywords :
BiCMOS integrated circuits; Ge-Si alloys; MIMIC; compensation; demultiplexing equipment; integrated circuit noise; large scale integration; millimetre wave oscillators; multiplexing equipment; optical communication equipment; phase noise; voltage-controlled oscillators; 0.18 micron; 39.8 GHz; 40 Gbit/s; 43 GHz; BiCMOS; MUX/DEMUX LSI; SiGe; clock signal; data rates; demultiplexer; dual mode operation; frequency doubler; half frequency VCO; large scale integration; low temperature drift; multiplexer; optical communication systems; phase noise; process deviation tolerance; propagation delay time; single-chip; temperature compensation technique; voltage controlled oscillator; wide tuning range; BiCMOS integrated circuits; Clocks; Fluctuations; Frequency; Germanium silicon alloys; Phase noise; Silicon germanium; Temperature distribution; Tuning; Voltage-controlled oscillators;
Conference_Titel :
Radio Frequency Integrated Circuits (RFIC) Symposium, 2004. Digest of Papers. 2004 IEEE
Print_ISBN :
0-7803-8333-8
DOI :
10.1109/RFIC.2004.1320608