• DocumentCode
    3280307
  • Title

    Coherent synchrotron radiation measurements in the THz region at the CLS far infrared beamline

  • Author

    May, Timothy E. ; Bergstrom, John C. ; Dallin, Les O. ; Appadoo, Dominique R T

  • Author_Institution
    Canadian Light Source, Inc., Saskatoon, SK
  • fYear
    2008
  • fDate
    15-19 Sept. 2008
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Synchrotron radiation (SR) in the far infrared region is used for high spectral resolution experiments at the Canadian Light Source (CLS). Although SR photon flux can exceed that of thermal sources at long wavelengths, a further increase in flux is obtained by shortening electron bunch lengths to the order of far infrared wavelengths. When shortened, the electron bunch photon output is boosted by coherent summation of the synchrotron radiation (CSR). Accelerator parameters were adjusted for short bunch lengths and CSR in burst mode at the Far Infrared beamline was observed. Preliminary results are discussed in the 5 to 40 cm-1 region (0.15 to 1.2 THz). Several unexpected features have been observed in the spectral energy curve at resolutions below 0.1 cm-1 (3 GHz). A theoretical model locating the spectral intensity peaks at high spectral resolution indicates that vacuum chamber geometry and side wall impedance effects may be responsible. A spectrum of nitrous oxide was obtained using the CSR.
  • Keywords
    beam handling techniques; synchrotron radiation; CLS far infrared beamline; Canadian Light Source; electron bunch photon; frequency 0.15 THz to 1.2 THz; frequency 3 GHz; photon flux; spectral energy curve; synchrotron radiation; Electrons; Energy resolution; Geometry; Impedance; Infrared spectra; Light sources; Solid modeling; Strontium; Synchrotron radiation; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared, Millimeter and Terahertz Waves, 2008. IRMMW-THz 2008. 33rd International Conference on
  • Conference_Location
    Pasadena, CA
  • Print_ISBN
    978-1-4244-2119-0
  • Electronic_ISBN
    978-1-4244-2120-6
  • Type

    conf

  • DOI
    10.1109/ICIMW.2008.4665814
  • Filename
    4665814