Title :
Vertical contact position detection and grasping force monitoring for micro-gripper applications
Author :
Porta, M. ; Wei, J. ; Tichem, M. ; Sarro, P.M. ; Staufer, U.
Author_Institution :
Delft Inst. of Microsyst. & Nanoelectron. (DIMES), Delft Univ. of Technol., Delft, Netherlands
Abstract :
A piezoresistive sensor for micro-grippers, capable of detecting the contact position of the micro-object along the vertical dimension of the grasping surface as well as the grasping force, has been developed and successfully tested. The integration of this sensor into micro-grippers would improve their reliability because the monitoring of the grasping position is fundamental in many micro-assembly tasks. The device is fabricated with an IC-compatible process and integrates two force sensors in a Wheatstone bridge configuration, whose outputs allow the computation of the contact position and the applied force. The sensors sensitivity is 16.9 V/N, with a supply of 1 V across the Wheatstone bridge. The maximum detectable contact force is up to 3 mN with an estimated resolution better than 1 ¿N. The resolution of the grasping position depends on the applied force. Results show that position with a resolution of 10 ¿m can be distinguished along the vertical direction of the grasping surface when a force of 1 mN is applied.
Keywords :
force measurement; force sensors; grippers; micromanipulators; microsensors; piezoresistive devices; Wheatstone bridge configuration; force sensors; grasping force monitoring; grasping surface; microassembly; microgripper; piezoresistive sensor; reliability; sensitivity; vertical contact position detection; voltage 1 V; Adhesives; Assembly; Bridge circuits; Force control; Force sensors; Grippers; Monitoring; Nanoelectronics; Piezoresistance; Testing;
Conference_Titel :
Sensors, 2009 IEEE
Conference_Location :
Christchurch
Print_ISBN :
978-1-4244-4548-6
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2009.5398198