• DocumentCode
    3280332
  • Title

    Atomic force microscopy based nano manipulation towards CNT-ISFET pH sensing system

  • Author

    Dong, Zhuxin ; Wejinya, Uchechukwu C. ; Chalamalasetty, Siva Naga S ; Margis, Matthew R.

  • Author_Institution
    Dept. of Mech. Eng., Univ. of Arkansas, Fayetteville, AR, USA
  • fYear
    2011
  • fDate
    20-23 Feb. 2011
  • Firstpage
    100
  • Lastpage
    104
  • Abstract
    In this paper, we present a novel means by which nano manipulation can be realized on a field effect transistor (FET) surface. Using atomic force microscopy (AFM) tip as a manipulation tool, micro and nano scale channels are created between the gap of a pair of gold (Au) electrodes. Following a dielectrophoresis (DEP) process, carbon nanotubes (CNTs) are deposited and aligned perfectly inside the channels cut by the AFM. Then, the two electrodes are bridged and ready to be developed as an ion-selective field effect transistor (ISFET) structure that has the potential to work as a high-performance pH sensor. Owing to the unique electrical properties of CNTs, such as conductivity (either metallic or semiconducting) and great current carrying capacity (~1 TA/cm3), there is a huge possibility that this CNT-based ISFET system is a much better replacement for the existing ISFET-based pH sensors. The pH sensing system will be much more compact, cheaper and reproducible, and no longer need outside amplifier circuits, which will have huge benefits in industry, biology as well as medicine.
  • Keywords
    atomic force microscopy; carbon nanotubes; chemical sensors; electrophoresis; ion sensitive field effect transistors; nanoelectronics; CNT-ISFET pH sensing system; DEP process; FET surface; atomic force microscopy; carbon nanotubes; dielectrophoresis process; field effect transistor surface; ion-selective field effect transistor; nano manipulation; Carbon nanotubes; Electrodes; FETs; Force; Gold; Nanobioscience; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems (NEMS), 2011 IEEE International Conference on
  • Conference_Location
    Kaohsiung
  • Print_ISBN
    978-1-61284-775-7
  • Type

    conf

  • DOI
    10.1109/NEMS.2011.6017305
  • Filename
    6017305