• DocumentCode
    3280586
  • Title

    Stress reduction induced by Bosch scallops on an open TSV technology

  • Author

    Singulani, A.P. ; Ceric, H. ; Langer, E.

  • Author_Institution
    Inst. for Microelectron., Tech. Univ. Wien, Vienna, Austria
  • fYear
    2013
  • fDate
    13-15 June 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Through Silicon Via (TSV) is a lead topic in interconnects and 3D integration research, mainly due to numerous anticipated advantages. However, several challenges must still be overcome if large scale production is to be achieved. In this work, we have studied effects of Bosch scallops concerning mechanical reliability for a specific TSV technology. We identified that the presence of scallops on the TSV wall modifies the stress distribution. The achieved results support experiments and give a better insight into the influence of scallops in an open TSV.
  • Keywords
    integrated circuit interconnections; integrated circuit reliability; three-dimensional integrated circuits; 3D integration research; Bosch scallops; TSV wall; interconnects; large scale production; mechanical reliability; open TSV technology; stress distribution; stress reduction; through silicon via; Adhesives; Geometry; Reliability; Silicon; Stress; Through-silicon vias; Tungsten;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Interconnect Technology Conference (IITC), 2013 IEEE International
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-1-4799-0438-9
  • Type

    conf

  • DOI
    10.1109/IITC.2013.6615578
  • Filename
    6615578