Title :
Stress reduction induced by Bosch scallops on an open TSV technology
Author :
Singulani, A.P. ; Ceric, H. ; Langer, E.
Author_Institution :
Inst. for Microelectron., Tech. Univ. Wien, Vienna, Austria
Abstract :
Through Silicon Via (TSV) is a lead topic in interconnects and 3D integration research, mainly due to numerous anticipated advantages. However, several challenges must still be overcome if large scale production is to be achieved. In this work, we have studied effects of Bosch scallops concerning mechanical reliability for a specific TSV technology. We identified that the presence of scallops on the TSV wall modifies the stress distribution. The achieved results support experiments and give a better insight into the influence of scallops in an open TSV.
Keywords :
integrated circuit interconnections; integrated circuit reliability; three-dimensional integrated circuits; 3D integration research; Bosch scallops; TSV wall; interconnects; large scale production; mechanical reliability; open TSV technology; stress distribution; stress reduction; through silicon via; Adhesives; Geometry; Reliability; Silicon; Stress; Through-silicon vias; Tungsten;
Conference_Titel :
Interconnect Technology Conference (IITC), 2013 IEEE International
Conference_Location :
Kyoto
Print_ISBN :
978-1-4799-0438-9
DOI :
10.1109/IITC.2013.6615578