DocumentCode
3280586
Title
Stress reduction induced by Bosch scallops on an open TSV technology
Author
Singulani, A.P. ; Ceric, H. ; Langer, E.
Author_Institution
Inst. for Microelectron., Tech. Univ. Wien, Vienna, Austria
fYear
2013
fDate
13-15 June 2013
Firstpage
1
Lastpage
2
Abstract
Through Silicon Via (TSV) is a lead topic in interconnects and 3D integration research, mainly due to numerous anticipated advantages. However, several challenges must still be overcome if large scale production is to be achieved. In this work, we have studied effects of Bosch scallops concerning mechanical reliability for a specific TSV technology. We identified that the presence of scallops on the TSV wall modifies the stress distribution. The achieved results support experiments and give a better insight into the influence of scallops in an open TSV.
Keywords
integrated circuit interconnections; integrated circuit reliability; three-dimensional integrated circuits; 3D integration research; Bosch scallops; TSV wall; interconnects; large scale production; mechanical reliability; open TSV technology; stress distribution; stress reduction; through silicon via; Adhesives; Geometry; Reliability; Silicon; Stress; Through-silicon vias; Tungsten;
fLanguage
English
Publisher
ieee
Conference_Titel
Interconnect Technology Conference (IITC), 2013 IEEE International
Conference_Location
Kyoto
Print_ISBN
978-1-4799-0438-9
Type
conf
DOI
10.1109/IITC.2013.6615578
Filename
6615578
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