• DocumentCode
    3280715
  • Title

    Improved InGaP/GaAs HBTs AC performance and linearity with collector design

  • Author

    Wang, Che-Ming ; Hsu, Hung-Tsao ; Shu, Hsiu-Chuan ; Liu, Yu-An ; Hsin, Yue-Ming

  • Author_Institution
    Dept. of Electr. Eng., Nat. Central Univ., Chung-li, Taiwan
  • fYear
    2004
  • fDate
    6-8 June 2004
  • Firstpage
    391
  • Lastpage
    394
  • Abstract
    An additional thin high-doping layer within the collector of InGaP/GaAs HBTs has been designed and fabricated to improve the Kirk effect threshold current, cutoff frequency, and power distortion, while keeping a high breakdown voltage. The proposed structure effectively relieves the Kirk effect and results in a higher current drive and cut-off frequency. From the extracted CBC with VCB, HBTs with non-uniform collector doping demonstrate less base-collector capacitance variation than that in baseline HBTs, due to the depletion region limited by the thin, high-doping layer. The experimental results on third-order intermodulation demonstrate a significant improvement in OIP3 by as large as 6 dB. This proposed InGaP/GaAs HBT, with non-uniform collector doping, is well suited to replace current InGaP/GaAs HBTs for power amplifier applications, due to its significantly improved linearity and current/frequency capability, with negligible impact on DC characteristics and fabrication.
  • Keywords
    III-V semiconductors; doping profiles; gallium compounds; heterojunction bipolar transistors; indium compounds; intermodulation; power amplifiers; power bipolar transistors; semiconductor device breakdown; HBT AC performance; HBT linearity; InGaP-GaAs; Kirk effect threshold current; OIP3; base-collector capacitance variation; collector thin high-doping layer; cutoff frequency; high breakdown voltage; nonuniform collector doping; power amplifier applications; power distortion; third-order intermodulation; Capacitance; Cutoff frequency; Doping; Fabrication; Gallium arsenide; Heterojunction bipolar transistors; Kirk field collapse effect; Linearity; Power amplifiers; Threshold current;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Frequency Integrated Circuits (RFIC) Symposium, 2004. Digest of Papers. 2004 IEEE
  • ISSN
    1529-2517
  • Print_ISBN
    0-7803-8333-8
  • Type

    conf

  • DOI
    10.1109/RFIC.2004.1320631
  • Filename
    1320631