Optimizing the use of component-level BIT in system-level test and diagnosis: a consistent diagnostic information architecture approach

The need to improve system-level test and diagnosis is particularly crucial in today´s environment in which the service lives of systems are being extended, making the reduction of operation and support (O&S) costs more imperative. Component-level built-in-test (BIT) represents a potentially significant contributor to this process. Unfortunately, there are both significant challenges associated with effectively using component-level BIT information in system-level test and diagnostic implementations as well as shortfalls in the overall performance of elements of the integrated diagnostic process. Research conducted as part of the Open Systems Approach to Integrated Diagnostics Demonstration (OSAIDD) program has shown that these shortfalls have been evident in products from both the public and private sectors. System integrators and acquisition managers of commercial and military products would greatly benefit from a consistent approach to the design and implementation of a system´s diagnostic capability within which the use of component-level BIT could be improved. This paper proposes a consistent, information-based architecture as an extensible solution to address this deficiency. The extensibility of this architecture will be highlighted by showing its applicability to both new development and legacy systems