DocumentCode
328089
Title
Different approaches to diagnostic modeling
Author
Ben-Bassat, Moshe ; Beniaminy, Israel ; Joseph, David
Author_Institution
IET Intelligent Electron., Anaheim, CA, USA
fYear
1998
fDate
24-27 Aug 1998
Firstpage
175
Lastpage
186
Abstract
This paper analyzes several different approaches taken by software development in creating diagnostic modeling or fault isolation. The significance of these differences is not just technical. Different approaches vary widely in their performance, in how well they address different situations, and even more widely in the amount of work required to “teach” the software about each type of equipment. These differences translate into such important factors as deployment cost, and number and duration of necessary repairs. Two important aspects characterize each approach: 1) type of modeling (deep or shallow), crucial to the amount of work required to create, validate, and modify the fault isolation application, and 2) the attitude taken towards less common faults; can they be ignored if common faults are handled efficiently, or are they viewed as primary contributors to cost and delays? We will explain the different approaches to diagnosis and compare their relative advantages and disadvantages using simple examples
Keywords
automatic test equipment; fault location; fault trees; knowledge based systems; software engineering; common faults; diagnostic modeling; fault isolation; fault tree; modeling; rule based knowledge; software development; support software; Application software; Costs; Delay; Diagnostic expert systems; Documentation; Fault trees; Position measurement; Programming; Software performance; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '98. IEEE Systems Readiness Technology Conference., 1998 IEEE
Conference_Location
Salt Lake City, UT
ISSN
1088-7725
Print_ISBN
0-7803-4420-0
Type
conf
DOI
10.1109/AUTEST.1998.713441
Filename
713441
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