Title :
Development of 3D-stacked reconfigurable spin logic chip using via-last backside-via 3D integration technology
Author :
Tanaka, T. ; Kino, Hitoshi ; Kiyoyama, K. ; Ohno, Hideo ; Koyanagi, Mitsumasa
Author_Institution :
Grad. Sch. of Biomed. Eng., Tohoku Univ., Sendai, Japan
Abstract :
A novel 3D-stacked reconfigurable spin logic chip has been successfully developed to overcome drawbacks of conventional reconfigurable LSIs. Two reconfigurable spin logic chips were carefully designed and successfully stacked using via-last backside-via technology. The fastest write speed of 5 ns was obtained in the on-chip SPRAM circuits. In order to achieve higher performance reconfigurable LSIs, parallel reconfiguration was realized with the stacked reconfigurable spin logic chips. Both via-last backside-via 3D integration and ultrafast on-chip SPRAM will bring a new reconfigurable LSI world.
Keywords :
integrated logic circuits; large scale integration; random-access storage; three-dimensional integrated circuits; 3D-stacked reconfigurable spin logic chip; parallel reconfiguration; reconfigurable LSIs; spin-transfer torque RAM; ultrafast on-chip SPRAM; via-last backside-via 3D integration technology; Educational institutions; Fabrication; Large scale integration; Magnetic tunneling; Random access memory; System-on-chip; Three-dimensional displays;
Conference_Titel :
Interconnect Technology Conference (IITC), 2013 IEEE International
Conference_Location :
Kyoto
Print_ISBN :
978-1-4799-0438-9
DOI :
10.1109/IITC.2013.6615594