DocumentCode
328091
Title
VXI RF measurement analyzer
Author
Gooding, Mike
Author_Institution
ARGOSyst. Inc., Sunnyvale, CA, USA
fYear
1998
fDate
24-27 Aug 1998
Firstpage
254
Lastpage
258
Abstract
VXI has grown substantially in applications from testing in the lab to field support of weapon systems. Early criticism of VXI came that it was only intended for low frequency applications. Recently, developers have been taking on the challenge of extending VXI into the RF and microwave frequency domain. This paper describes the challenges of creating an 8.5 GHz RF measurement analyzer in a VXI environment
Keywords
automatic test equipment; microwave measurement; network analysers; peripheral interfaces; virtual instrumentation; 8.5 GHz; ADC; AS230 signal analyzer; AS231 VXI C-size module; VXI COTS; VXI RF measurement analyzer; downconvertor; microwave frequency; pipelined DSP; virtual instrument panel; Baseband; Digital signal processing; Frequency measurement; Power measurement; RF signals; Radio frequency; Signal analysis; Signal processing; System testing; Weapons;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '98. IEEE Systems Readiness Technology Conference., 1998 IEEE
Conference_Location
Salt Lake City, UT
ISSN
1088-7725
Print_ISBN
0-7803-4420-0
Type
conf
DOI
10.1109/AUTEST.1998.713453
Filename
713453
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