DocumentCode
328098
Title
Digital model reuse in VXI testing
Author
Wright, R. Glenn ; Kirkland, Larry V.
Author_Institution
GMA Ind. Inc., Annapolis, MD, USA
fYear
1998
fDate
24-27 Aug 1998
Firstpage
597
Lastpage
599
Abstract
This paper describes ongoing research and development of a means for reusing existing digital models and test vectors that reside in IEEE P1445 (Digital Test Interchange Format-DTIF) format for digital test programs that are currently hosted on obsolete and nonsupported automatic test equipment. Our approach promotes the rendering of DTIF products into VXIbus-compatible files that are interoperable across a wide variety of VXI testers, independent of instrument manufacturer
Keywords
aerospace testing; automatic test equipment; software reusability; DTIF; VXI testing; digital model reuse; digital test interchange format; nonsupported automatic test equipment; test vectors; Automatic testing; Circuit testing; Data structures; Information analysis; Job shop scheduling; Manufacturing; Performance evaluation; Research and development; System testing; Usability;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '98. IEEE Systems Readiness Technology Conference., 1998 IEEE
Conference_Location
Salt Lake City, UT
ISSN
1088-7725
Print_ISBN
0-7803-4420-0
Type
conf
DOI
10.1109/AUTEST.1998.713503
Filename
713503
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