Title :
Digital model reuse in VXI testing
Author :
Wright, R. Glenn ; Kirkland, Larry V.
Author_Institution :
GMA Ind. Inc., Annapolis, MD, USA
Abstract :
This paper describes ongoing research and development of a means for reusing existing digital models and test vectors that reside in IEEE P1445 (Digital Test Interchange Format-DTIF) format for digital test programs that are currently hosted on obsolete and nonsupported automatic test equipment. Our approach promotes the rendering of DTIF products into VXIbus-compatible files that are interoperable across a wide variety of VXI testers, independent of instrument manufacturer
Keywords :
aerospace testing; automatic test equipment; software reusability; DTIF; VXI testing; digital model reuse; digital test interchange format; nonsupported automatic test equipment; test vectors; Automatic testing; Circuit testing; Data structures; Information analysis; Job shop scheduling; Manufacturing; Performance evaluation; Research and development; System testing; Usability;
Conference_Titel :
AUTOTESTCON '98. IEEE Systems Readiness Technology Conference., 1998 IEEE
Conference_Location :
Salt Lake City, UT
Print_ISBN :
0-7803-4420-0
DOI :
10.1109/AUTEST.1998.713503
