Title :
An optimized model of skin effect for on-chip spiral inductors
Author :
Sun, X. ; Carchon, G. ; De Raedt, W.
Author_Institution :
Microwave & RF Syst. Group, IMEC, Leuven, Belgium
Abstract :
An accurate equivalent network for modeling the skin effect is presented. Rules for choosing the number of parallel R-L branches for precisely modeling the skin effect in spiral inductors are presented. The concept has been verified using high-Q on-chip inductors realized using wafer level packaging techniques. A good agreement between measurements and simulations has been obtained up to the first resonance.
Keywords :
MMIC; Q-factor; equivalent circuits; integrated circuit packaging; lumped parameter networks; radiofrequency integrated circuits; semiconductor device measurement; semiconductor device models; skin effect; thin film inductors; equivalent network; high-Q on-chip inductors; lumped-element model; measurements; on-chip spiral inductors; optimized skin effect model; parallel R-L branches; resonance; simulations; wafer level packaging techniques; Circuit simulation; Current density; Inductance; Inductors; Integrated circuit modeling; Radio frequency; Semiconductor device modeling; Skin effect; Spirals; Wafer scale integration;
Conference_Titel :
Radio Frequency Integrated Circuits (RFIC) Symposium, 2004. Digest of Papers. 2004 IEEE
Print_ISBN :
0-7803-8333-8
DOI :
10.1109/RFIC.2004.1320649
