DocumentCode
3281177
Title
Improvement of transient response for drive loop of microgyroscope using 2-DOF PID controller
Author
Cui, Jian ; Guo, Zhongyang ; Yang, Zhenchuan ; Hao, Yilong ; Yan, Guizhen
Author_Institution
Inst. of Microelectron., Peking Univ., Beijing, China
fYear
2011
fDate
20-23 Feb. 2011
Firstpage
281
Lastpage
284
Abstract
This paper presents a novel control strategy for the drive loop of microgyroscope based on two degree-of -freedom (2-DOF) PID controller. Compared with the conventional AGC-1DOF PID controller, the proposed AGC-2DOF PID controller can realize self-oscillation of the microgyroscope with improved transient response by moving some portions of the proportional and the derivative components of the single PID controller to the feedback path. A tuning fork micromachined gyroscope is fabricated to verify the revised controller. The resonant frequency and the quality factor of the drive mode are measured to be 2.528 kHz and 84 at the atmosphere, respectively. The test results demonstrate that the percent overshoot is reduced from 36.2% (1DOF PID) to 4.35% with approximately 3.35% improved in setting time. The signal-to-noise ratio (SNR) of the excitation signal is larger than 88dB. The scale factor is measured to be about 33.5mv/deg/s with the non-linearity about 0.5% within the range of ±400deg/s.
Keywords
closed loop systems; gyroscopes; micromachining; micromechanical devices; three-term control; transient response; vibration control; AGC-2DOF PID controller; drive loop; drive mode; excitation signal; feedback path; microgyroscope; quality factor; resonant frequency; signal-to-noise ratio; transient response; tuning fork micromachined gyroscope; two degree-of-freedom PID controller; Atmospheric measurements; Gyroscopes; Micromechanical devices; Q factor; Steady-state; Transient response; Vibrations; MEMS gyroscope; closed-loop control; transient response; two degree of freedom PID;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems (NEMS), 2011 IEEE International Conference on
Conference_Location
Kaohsiung
Print_ISBN
978-1-61284-775-7
Type
conf
DOI
10.1109/NEMS.2011.6017348
Filename
6017348
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