DocumentCode
3281198
Title
Switching characteristics of a thermally-stable metal contact RF MEMS switch
Author
Deng, Peigang ; Wang, Ping
Author_Institution
SoC Key Lab., Peking Univ. Shenzhen, Shenzhen, China
fYear
2011
fDate
20-23 Feb. 2011
Firstpage
285
Lastpage
288
Abstract
A metal contact RF MEMS switch was fabricated based on the micro electroplating technology. With the optimized electroplating parameters, the plated Au beam showed very low stress/stress gradient, indicated by a deformation (tip-up) less than 1 μm after release and an annealing process. The pull-in voltage at different temperatures, ranging from 25°C to 90°C, was investigated for switches with and without the annealing process. The switching characteristics were studied under different actuation voltages and temperatures. The DC testing results revealed that a fast, stable (less beam vibration) and temperature-independent switching process could be realized if the actuation voltage was set to be, for example 10%, larger than the pull-in voltage.
Keywords
annealing; electroplating; microswitches; Au; annealing process; microelectroplating technology; plated gold beam; switching characteristics; temperature 25 C to 90 C; thermally-stable metal contact RF MEMS switch; Annealing; Contacts; Gold; Microswitches; Radio frequency; Temperature; RF MEMS switch; micro electroplating; switching characteristics; thermal stability;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems (NEMS), 2011 IEEE International Conference on
Conference_Location
Kaohsiung
Print_ISBN
978-1-61284-775-7
Type
conf
DOI
10.1109/NEMS.2011.6017349
Filename
6017349
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