Title :
Polarization information for terahertz imaging
Author :
Zhang, Yan ; Zhang, Ranxi ; Cui, Ye ; Sun, Wenfeng
Author_Institution :
Dept. of Phys., Capital Normal Univ., Beijing
Abstract :
A method to analyze the variety of the polarization state of terahertz (THz) wave by using a typical electro-optic sampling setup with <110> zinc-blende (ZnTe) crystal as a sensor is presented. To illustrate the knowledge of polarization of the THz pulse, the function of THz detect in ZnTe crystal is interpreted. Two kinds of Jones matrixes, birefringence device and polarizer device, are used to analyses the polarization change of the THz electric field vector caused by the sample. It was found that the THz polarization imaging is sensitive to the edge of the samples.
Keywords :
II-VI semiconductors; electromagnetic wave polarisation; submillimetre wave imaging; terahertz wave detectors; terahertz wave imaging; Jones matrix; THz electric field vector; THz polarization imaging; ZnTe; birefringence; electro-optic sampling setup; polarizer; sensor; zinc-blende ZnTe crystal; Birefringence; Electromagnetic scattering; Electromagnetic wave absorption; High-resolution imaging; Light scattering; Microwave imaging; Optical imaging; Plastics; Polarization; Zinc compounds;
Conference_Titel :
Infrared, Millimeter and Terahertz Waves, 2008. IRMMW-THz 2008. 33rd International Conference on
Conference_Location :
Pasadena, CA
Print_ISBN :
978-1-4244-2119-0
Electronic_ISBN :
978-1-4244-2120-6
DOI :
10.1109/ICIMW.2008.4665865
