• DocumentCode
    3281971
  • Title

    Iterative simulation-based Genetics + Deterministic Techniques = Complete AtPG

  • Author

    Saab, Daniel G. ; Saab, Youssef G. ; Abraham, Jacob A.

  • fYear
    1994
  • fDate
    6-10 Nov 1994
  • Firstpage
    40
  • Lastpage
    43
  • Keywords
    Automatic test pattern generation; Central Processing Unit; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Genetics; Logic testing; Sequential analysis; Sequential circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 1994., IEEE/ACM International Conference on
  • ISSN
    1063-6757
  • Print_ISBN
    0-8186-3010-8
  • Type

    conf

  • DOI
    10.1109/ICCAD.1994.629741
  • Filename
    629741
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3281971