Title :
Analytical Fault Modeling And Static Test Generation For Analog ICs
Author :
Devarayanadurg, Giri ; Soma, Mani
Keywords :
Analytical models; Circuit faults; Circuit testing; Contracts; Costs; Electrical fault detection; Fault detection; Minimax techniques; Packaging; Performance evaluation;
Conference_Titel :
Computer-Aided Design, 1994., IEEE/ACM International Conference on
Print_ISBN :
0-8186-3010-8
DOI :
10.1109/ICCAD.1994.629742
