DocumentCode
3281982
Title
Analytical Fault Modeling And Static Test Generation For Analog ICs
Author
Devarayanadurg, Giri ; Soma, Mani
fYear
1994
fDate
6-10 Nov 1994
Firstpage
44
Lastpage
47
Keywords
Analytical models; Circuit faults; Circuit testing; Contracts; Costs; Electrical fault detection; Fault detection; Minimax techniques; Packaging; Performance evaluation;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design, 1994., IEEE/ACM International Conference on
ISSN
1063-6757
Print_ISBN
0-8186-3010-8
Type
conf
DOI
10.1109/ICCAD.1994.629742
Filename
629742
Link To Document