DocumentCode
3281992
Title
Surface profile detection by transverse Doppler frequency shift
Author
Li, Lin ; Chen, Xiangdong ; Wang, Xin-min ; Dong, Tian-lin
Author_Institution
Dept. of Electron. & Inf. Eng., Huazhong Univ. of Sci. & Technol., Wuhan, China
fYear
2011
fDate
15-17 April 2011
Firstpage
1755
Lastpage
1756
Abstract
It is a common sense that the Doppler frequency shift is vanished when the speed of a planar interface is transverse to the wave incidence. However, our theoretical and experimental research shows that the Doppler frequency shift is non-zero for a curved interface with even purely transverse speed, and this physic effect can be used to detect the surface profile.
Keywords
Doppler shift; electromagnetic wave scattering; periodic structures; Doppler frequency shift; physic effect; planar interface; surface profile detection; Doppler effect; Measurement by laser beam; Measurement techniques; Optical surface waves; Optics; Periodic structures; Surface waves; Doppler frequency shift; surface profile detection;
fLanguage
English
Publisher
ieee
Conference_Titel
Electric Information and Control Engineering (ICEICE), 2011 International Conference on
Conference_Location
Wuhan
Print_ISBN
978-1-4244-8036-4
Type
conf
DOI
10.1109/ICEICE.2011.5777698
Filename
5777698
Link To Document