Title :
An efficient cubic spline approach to lifetime estimation [VSLI]
Author :
Huang, Min ; Styblinski, M.A.
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
Abstract :
The problem of VLSI circuit lifetime estimation is discussed. It is shown that lifetime determination is equivalent to finding the smallest zero of a continuous nondifferentiable function for a specific circuit realization. An iterative multiple cubic spline approximation algorithm is proposed to determine the lifetime. The application to VLSI circuit analysis is described, in which the degradation resulting from the hot electron effects are considered. The results presented confirm the efficiency of the proposed approach
Keywords :
VLSI; circuit reliability; failure analysis; function approximation; hot carriers; iterative methods; splines (mathematics); VLSI circuit analysis; cubic spline; hot electron effects; iterative multiple cubic spline approximation algorithm; lifetime estimation; Circuit analysis; Circuit noise; Circuit simulation; Degradation; Electrons; Failure analysis; Life estimation; Lifetime estimation; Spline; Very large scale integration;
Conference_Titel :
Circuits and Systems, 1992. ISCAS '92. Proceedings., 1992 IEEE International Symposium on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0593-0
DOI :
10.1109/ISCAS.1992.230693
