DocumentCode :
3282386
Title :
Degradation of Characteristics and Critical Bit-Flip Errors in Cascaded 3-Stage CMOS Inverters due to RF Interference
Author :
Kim, Kyechong ; Iliadis, Agis A.
fYear :
2005
fDate :
Dec. 7-9, 2005
Firstpage :
5
Lastpage :
6
Keywords :
Degradation; Digital systems; Electromagnetic interference; Frequency; Inverters; Power dissipation; Probes; RF signals; Radiofrequency interference; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Device Research Symposium, 2005 International
Print_ISBN :
1-4244-0083-X
Type :
conf
DOI :
10.1109/ISDRS.2005.1595948
Filename :
1595948
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3282386
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