DocumentCode

3282464

Title

Scaling Rules for Tunnel Field-Effect Transistors

Author

Bhuwalka, Krishna K. ; Born, Mathias ; Schindler, Markus ; Eisele, Ignaz

fYear

2005

fDate

Dec. 7-9, 2005

Firstpage

13

Lastpage

14

Keywords

Degradation; Equations; FETs; Leakage current; MOSFETs; P-i-n diodes; Photonic band gap; Predictive models; Tunneling; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Semiconductor Device Research Symposium, 2005 International

Print_ISBN

1-4244-0083-X

Type

conf

DOI

10.1109/ISDRS.2005.1595952

Filename

1595952