• DocumentCode
    3282482
  • Title

    A Deadlock-Free High-Throughput Tree Algorithm for Random Access over Fading Channels

  • Author

    Wang, Xin ; Yu, Yingqun ; Giannakis, Georgios B.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Minnesota Univ., Minneapolis, MN
  • fYear
    2006
  • fDate
    22-24 March 2006
  • Firstpage
    420
  • Lastpage
    425
  • Abstract
    We recently proposed a random access scheme which combines the widely used binary exponential backoff (BEB) algorithm with a cross-layer tree algorithm (TA), which relies on successive interference cancellation (SIC) with first success (FS). It was shown that BEB and SICTA/FS complement each other nicely and the proposed protocol can afford a maximum stable throughput (MST) as high as 0.6 without packet loss. However, although BEB-SICTA/FS avoids the deadlock problem caused by the error propagation of successive interference cancellation (SIC), it may still suffer from deadlock effects induced by the "level skipping" under harsh wireless channels. In this paper, we develop a novel BEB-SICTA/F1 protocol, which is a modified version of BEB-SICTA/FS. Our analysis and simulations demonstrate that this simple modification can afford high-throughput random access while completely avoiding deadlock problems.
  • Keywords
    fading channels; interference suppression; protocols; radiofrequency interference; trees (mathematics); BEB; MST; SICTA-FS; binary exponential backoff algorithm; deadlock problem; error propagation; fading channel; first success; level skipping; maximum stable throughput; protocol; random access scheme; successive interference cancellation; tree algorithm; wireless channel; Access protocols; Analytical models; Computer aided analysis; Fading; Feedback; Interference cancellation; Physical layer; Silicon carbide; System recovery; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Sciences and Systems, 2006 40th Annual Conference on
  • Conference_Location
    Princeton, NJ
  • Print_ISBN
    1-4244-0349-9
  • Electronic_ISBN
    1-4244-0350-2
  • Type

    conf

  • DOI
    10.1109/CISS.2006.286504
  • Filename
    4067845