DocumentCode
3282497
Title
A plasma spectroscopic microdevice for on-site water monitoring
Author
Sweeney, John ; Whitney, Chad ; Wilson, Chester G.
Author_Institution
Inst. for Micromanufacturing, Louisiana Tech Univ., Ruston, LA, USA
fYear
2009
fDate
25-28 Oct. 2009
Firstpage
2005
Lastpage
2008
Abstract
Plasma spectroscopic techniques can provide a quick, on-site solution for monitoring the potability of water sources. This paper reports on a new, essentially disposable ceramic microdevice that utilizes on-chip doped DC plasmas to spectroscopically analyze the atomic and molecular composition of water samples on-site. The device is fabricated on an alumina ceramic substrate, which is ideal due to its low-cost, ability to be cast into micro-structures, mechanical robustness, and insulation of high-voltage. Water sample analysis is performed in air at atmospheric pressure, greatly reducing the cost and complexity of water quality monitoring on-site. Samples are partially evaporated with on-chip thin-film Cr microheater integrated into the cathode lead. Temperature changes as large as 47°C can be realized with 60 mA. With the device reported here, copper and aluminum impurities are detected at 100 ppm and ammonia contaminants are observed in concentrations as low as 1%.
Keywords
alumina; aluminium; ammonia; ceramics; contamination; copper; microsensors; plasma devices; spectrochemical analysis; water; water pollution measurement; water quality; Al; Al2O3; Cu; NH3; alumina ceramic substrate; aluminum impurities; ammonia contaminants; atomic composition; cathode lead; disposable ceramic microdevice; mechanical robustness; microstructures; molecular composition; on-chip doped DC plasmas; on-chip thin-film chromium microheater; on-site water quality monitoring; plasma spectroscopic microdevice; water source potability; Atmospheric-pressure plasmas; Ceramics; Insulation; Monitoring; Plasma devices; Plasma sources; Robustness; Spectroscopy; Substrates; Water resources;
fLanguage
English
Publisher
ieee
Conference_Titel
Sensors, 2009 IEEE
Conference_Location
Christchurch
ISSN
1930-0395
Print_ISBN
978-1-4244-4548-6
Electronic_ISBN
1930-0395
Type
conf
DOI
10.1109/ICSENS.2009.5398300
Filename
5398300
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