• DocumentCode
    3282514
  • Title

    A CMOS Compatible Single Polysilicon Embedded NVM

  • Author

    Bu, Jiankang ; Parker, Courtney ; Prosack, Hank

  • fYear
    2005
  • fDate
    Dec. 7-9, 2005
  • Firstpage
    21
  • Lastpage
    22
  • Keywords
    Capacitors; Costs; Degradation; Hot carriers; MOS devices; MOSFET circuits; Nonvolatile memory; Plasma temperature; Plasma transport processes; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium, 2005 International
  • Print_ISBN
    1-4244-0083-X
  • Type

    conf

  • DOI
    10.1109/ISDRS.2005.1595956
  • Filename
    1595956
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3282514