Surface plasmon resonance imaging with polarisation modulation

Author

Graham, David J L ; Watkins, Lionel R.

Author_Institution

Dept. of Phys., Univ. of Auckland, Auckland, New Zealand

fYear

2009

fDate

25-28 Oct. 2009

Firstpage

1997

Lastpage

2000

Abstract

We report the first imaging SPR instrument that uses polarisation modulation and ellipsometric detection. This instrument achieves a good combination of both spatial and refractive index resolution in a simple optical setup. The polarisation of the incident beam is modulated and the reflected light imaged onto a high speed CMOS camera. To demonstrate sensitivity and linearity, refractive index measurements were made with solutions of known index, yielding a sensitivity of 2.0 Ã— 10^-6 RIU. Measurements are also presented of a sample partially covered with a fluoropolymer layer to demonstrate imaging of a spatially varying refractive index.

Keywords

CMOS image sensors; image resolution; light polarisation; optical modulation; optical sensors; polymers; refractive index; refractive index measurement; surface plasmon resonance; ellipsometric detection; fluoropolymer layer; high speed CMOS camera; imaging SPR instrument; linearity; polarisation modulation; refractive index measurements; refractive index resolution; sensitivity; spatial resolution; spatially varying refractive index; surface plasmon resonance imaging; CMOS image sensors; High-resolution imaging; Instruments; Optical imaging; Optical modulation; Optical polarization; Plasmons; Refractive index; Resonance; Spatial resolution;

fLanguage

English

Publisher

ieee

Conference_Titel

Sensors, 2009 IEEE

Conference_Location

Christchurch

ISSN

1930-0395

Print_ISBN

978-1-4244-4548-6

Electronic_ISBN

1930-0395

Type

conf

DOI

10.1109/ICSENS.2009.5398306

Filename

5398306