DocumentCode
3282650
Title
I-V Characteristics Modeling and Parameter Extraction for CNT-FETs
Author
Marulanda, Jose M. ; Srivastava, Ashok
fYear
2005
fDate
Dec. 7-9, 2005
Firstpage
38
Lastpage
39
Keywords
Curve fitting; Electron emission; Equations; Nanoscale devices; Optical scattering; Parameter extraction; Phonons; Solid modeling; Virtual reality; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Device Research Symposium, 2005 International
Print_ISBN
1-4244-0083-X
Type
conf
DOI
10.1109/ISDRS.2005.1595965
Filename
1595965
Link To Document