Title :
Slope efficiency versus cavity length in quantum dot lasers
Author :
Asryan, Levon V.
Keywords :
Length measurement; Loss measurement; Measurement standards; Mirrors; Optical losses; Optical saturation; Optimized production technology; Quantum dot lasers; Semiconductor lasers; US Department of Transportation;
Conference_Titel :
Semiconductor Device Research Symposium, 2005 International
Print_ISBN :
1-4244-0083-X
DOI :
10.1109/ISDRS.2005.1595977