• DocumentCode
    3282856
  • Title

    An Impulse-Response Based Methodology for Modeling Complex Interconnect Networks

  • Author

    Dilli, Zeynep ; Goldsman, Neil ; Akturk, Akin

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Maryland Univ., College Park, MD
  • fYear
    2005
  • fDate
    7-9 Dec. 2005
  • Firstpage
    64
  • Lastpage
    65
  • Abstract
    We have presented a methodology for modeling complex on-chip interconnect networks in a computationally efficient manner. The method depends on defining unit cells, which can comprise any interconnect network, and assigning equivalent circuits to each unit cell, which are brought together to form a full network. We have showed that to find the response at a given point to a random input, all we need to calculate and store is the impulse responses at that point for impulses throughout the system. The physical effects of the semiconducting substrate and network layouts are reflected by the unit cell equivalent circuit design, the tradeoff being between the physical accuracy and complexity of the final network to be solved. The method is extendable to any interconnect network, including 3-D systems, simply by defining coupling networks between unit cells. Its flexibility allows rapid exploration of the responses of different layout types to various random or directed inputs, having solved for the impulse responses just once
  • Keywords
    equivalent circuits; integrated circuit interconnections; lumped parameter networks; network-on-chip; transient response; complex networks; equivalent circuits; impulse response; network layouts; on-chip interconnect networks modeling; semiconducting substrate; Coupling circuits; Educational institutions; Electromagnetic coupling; Electromagnetic modeling; Equivalent circuits; Frequency; Integrated circuit interconnections; Semiconductivity; Substrates; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium, 2005 International
  • Conference_Location
    Bethesda, MD
  • Print_ISBN
    1-4244-0083-X
  • Type

    conf

  • DOI
    10.1109/ISDRS.2005.1595979
  • Filename
    1595979