DocumentCode :
3282973
Title :
Process Integration, Characterization, Modeling and Reliability of a 10K Poly Resistor for Low Power Mixed Signal VLSI Applications
Author :
Anser, Muhammad ; Prasad, Jagdish
Author_Institution :
AMI Semicond., Pocatello, ID
fYear :
2005
fDate :
7-9 Dec. 2005
Firstpage :
80
Lastpage :
81
Abstract :
Many IC applications employ both analog and digital circuits, and therefore it is desirable to integrate both analog and digital functions on the same chip (mixed signal chip). A mixed signal chip uses logic gates to perform digital signal processing while the analog cells allow the chip to interface with the analog environment. These analog cells include I/O blocks containing resistors, capacitors, reference voltage sources and comparators. Integration of all these digital and analog components on a single chip offers high packing density and low power CMOS at a lower cost. Most commonly used materials for high R value resistors are nichrome, tantalum and cermet (Cr-SiO). Extra manufacturing steps involved in depositing and patterning of these films is expensive and therefore new and innovative process for high R value resistors is needed. The authors have integrated very reliable high R value poly silicon thin film resistors at the cost of one extra masking step in a CMOS process. The authors present the results on matching, flicker noise performance and reliability of poly silicon thin film 10K resistors. Also a comparison is performed with thin film HIPO (IK) resistor
Keywords :
CMOS integrated circuits; VLSI; flicker noise; low-power electronics; mixed analogue-digital integrated circuits; thin film resistors; CMOS process; Cr-SiO; HIPO resistor; VLSI; cermet; digital signal processing; flicker noise; high R value resistors; logic gates; low power CMOS; mixed signal chip; nichrome; poly silicon thin film resistors; reliability; tantalum; Analog integrated circuits; Application specific integrated circuits; Costs; Digital integrated circuits; Integrated circuit reliability; Resistors; Semiconductor thin films; Signal processing; Silicon; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Device Research Symposium, 2005 International
Conference_Location :
Bethesda, MD
Print_ISBN :
1-4244-0083-X
Type :
conf
DOI :
10.1109/ISDRS.2005.1595987
Filename :
1595987
Link To Document :
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