• DocumentCode
    3283003
  • Title

    Wideband 2N-port S-parameter extraction from N-port S-parameter data

  • Author

    Young, B.

  • Author_Institution
    Motorola Inc., Austin, TX
  • fYear
    1996
  • fDate
    28-30 Oct 1996
  • Firstpage
    150
  • Lastpage
    152
  • Abstract
    A complete characterization of an N-lead package, like a QFP, is a 2N×2N matrix of parameters, but measurements on all 2N ports can be difficult. The paper presents a technique for extracting the 2N×2N matrix from multiple N-port data sets
  • Keywords
    S-parameters; characteristics measurement; integrated circuit packaging; multiport networks; 2N×2N matrix; N-lead package; N-port S-parameter data; QFP; S-parameter extraction; multiple N-port data sets; wideband 2N-port;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging, 1996., IEEE 5th Topical Meeting
  • Conference_Location
    Napa, CA
  • Print_ISBN
    0-7803-3514-7
  • Type

    conf

  • DOI
    10.1109/EPEP.1996.564814
  • Filename
    564814
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3283003