Title :
Wideband 2N-port S-parameter extraction from N-port S-parameter data
Author_Institution :
Motorola Inc., Austin, TX
Abstract :
A complete characterization of an N-lead package, like a QFP, is a 2N×2N matrix of parameters, but measurements on all 2N ports can be difficult. The paper presents a technique for extracting the 2N×2N matrix from multiple N-port data sets
Keywords :
S-parameters; characteristics measurement; integrated circuit packaging; multiport networks; 2N×2N matrix; N-lead package; N-port S-parameter data; QFP; S-parameter extraction; multiple N-port data sets; wideband 2N-port;
Conference_Titel :
Electrical Performance of Electronic Packaging, 1996., IEEE 5th Topical Meeting
Conference_Location :
Napa, CA
Print_ISBN :
0-7803-3514-7
DOI :
10.1109/EPEP.1996.564814
