Title :
Degradation of Hexagonal Silicon Carbide-based Bipolar Devices
Keywords :
Commercialization; Degradation; Displays; Impedance; Materials science and technology; P-n junctions; Physics; Silicon carbide; Stacking; Voltage;
Conference_Titel :
Semiconductor Device Research Symposium, 2005 International
Print_ISBN :
1-4244-0083-X
DOI :
10.1109/ISDRS.2005.1596018
