• DocumentCode
    3283399
  • Title

    Degradation of Hexagonal Silicon Carbide-based Bipolar Devices

  • Author

    Skowronski, M.

  • fYear
    2005
  • fDate
    Dec. 7-9, 2005
  • Firstpage
    138
  • Lastpage
    138
  • Keywords
    Commercialization; Degradation; Displays; Impedance; Materials science and technology; P-n junctions; Physics; Silicon carbide; Stacking; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium, 2005 International
  • Print_ISBN
    1-4244-0083-X
  • Type

    conf

  • DOI
    10.1109/ISDRS.2005.1596018
  • Filename
    1596018
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3283399