DocumentCode :
3283428
Title :
Numerical analysis of impact of imprinting pressure on profile shape and mold deformation in UV-NIL
Author :
Du, Jun ; Wei, Zhengying ; He, Wei ; Tang, Yiping
Author_Institution :
State Key Lab. of Manuf. Syst. Eng., Xi´´an Jiaotong Univ., Xi´´an, China
fYear :
2011
fDate :
20-23 Feb. 2011
Firstpage :
792
Lastpage :
795
Abstract :
In this paper, in order to reveal the interrelationship among the imprinting pressure, the evolution profile and the mold deformation, a novel numerical model accounted for surface tension and contact angle was established to simulate the resist filling process and mold deformation by using computational fluid dynamics (CFD). As a basic study to understand the resist filling characteristics in UV-NIL, we had chosen a simple rectangular cavity as a computational domain. In order to fully account for the effect of imprinting pressure, numerical simulations have been performed for different imprinting pressure. The evolution profile of the resist and mold deformation was found to be significantly influenced by the imprinting pressure. Numerical results show that a higher imprinting pressure will make the profile shape of resist more flat, which can improve the filling rate of the resist and reduce the filling time. However, too high imprinting pressure is easy to cause larger mold deformation that is unfavorable to the demoulding process and finial quality of imprinted pattern. Through a synthetic consideration of the influence of the imprinting pressure on the evolution profile and the mold deformation, we considered that the optimum imprinting pressure should be about 0.1MPa.
Keywords :
computational fluid dynamics; contact angle; nanolithography; surface tension; ultraviolet lithography; CFD; UV-NIL; computational fluid dynamics; contact angle; evolution profile; imprinting pressure; mold deformation; nanoimprint lithography; profile shape; rectangular cavity; resist filling process; surface tension; Cavity resonators; Filling; Resists; Strain; Stress; Substrates; Viscosity; UV-NIL; imprinting pressure; mold deformation; profile shape;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2011 IEEE International Conference on
Conference_Location :
Kaohsiung
Print_ISBN :
978-1-61284-775-7
Type :
conf
DOI :
10.1109/NEMS.2011.6017473
Filename :
6017473
Link To Document :
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