• DocumentCode
    3283453
  • Title

    Distributed logic simulation: time-first evaluation vs. event driven algorithms

  • Author

    Sundaram, S. ; Patnaik, L.M.

  • Author_Institution
    Supercomput. Educ. & Res. Centre, Indian Inst. of Sci., Bangalore, India
  • fYear
    1996
  • fDate
    3-6 Jan 1996
  • Firstpage
    307
  • Lastpage
    310
  • Abstract
    With the increasing complexity of VLSI circuits, simulation of digital circuits is becoming a more complex and time-consuming task. General purpose parallel processing machines are increasingly being used to speed up a variety of VLSI CAD applications. All previous works on mapping sequential logic simulation algorithms onto general purpose parallel machines were centered around using event-driven algorithm, and do not satisfactorily address the suitability of a particular sequential algorithm for parallel implementation. In this paper, we present analysis of two distributed simulation algorithms: the centralized-time event-driven algorithm and the time-first evaluation algorithm, mapped onto a network of workstations. We present results over a wide range of ISCAS85 and ISCAS89 benchmark circuits, to show that the time-first evaluation algorithm is likely to be a viable alternative to the event-driven algorithm in the domain of parallel logic simulation
  • Keywords
    VLSI; circuit analysis computing; integrated logic circuits; logic CAD; parallel algorithms; VLSI circuits; digital circuit simulation; distributed logic simulation; distributed simulation algorithms; event driven algorithm; parallel logic simulation; parallel processing; time-first evaluation algorithm; Algorithm design and analysis; Analytical models; Circuit simulation; Digital circuits; Discrete event simulation; Logic; Parallel machines; Parallel processing; Very large scale integration; Workstations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 1996. Proceedings., Ninth International Conference on
  • Conference_Location
    Bangalore
  • ISSN
    1063-9667
  • Print_ISBN
    0-8186-7228-5
  • Type

    conf

  • DOI
    10.1109/ICVD.1996.489616
  • Filename
    489616