• DocumentCode
    328348
  • Title

    Subthreshold MOS implementation of neural networks with on-chip error backpropagation learning

  • Author

    Choi, Yoon Kyung ; Lee, Soo-Young

  • Author_Institution
    Comput. & Neural Syst. Lab., Korea Adv. Energy Res. Inst., Taejon, South Korea
  • Volume
    1
  • fYear
    1993
  • fDate
    25-29 Oct. 1993
  • Firstpage
    849
  • Abstract
    Subthreshold analog circuits for MOS implementation of artificial neural networks are presented with on-chip learning capability. Each synapse circuits consist of a storage capacitor and 3 analog multiplier, i.e. one for signal feedforward, one for outer-product synaptic weight adjustments, and one for error backpropagation. While all the 3 multipliers are used for error backpropagation learning, only the first 2 multipliers are used for Hebbian learning. Each neuron circuits are composed of a sigmoid circuit and a sigmoid derivative circuit, which show near ideal sigmoid characteristics and provide external gain-control capability. All the circuits incorporate modular architecture, and are designed to increase the numbers of neurons and layers with multiple chips. Also, the subthreshold operation provides low power consumption and large scale implementation.
  • Keywords
    CMOS analogue integrated circuits; Hebbian learning; analogue multipliers; backpropagation; large scale integration; multiplying circuits; neural chips; Hebbian learning; analog multiplier; large scale integration; modular architecture; neural networks; on-chip error backpropagation learning; outer-product synaptic weight adjustments; sigmoid circuit; signal feedforward; storage capacitor; subthreshold MOS; synapse circuits; Analog circuits; Artificial neural networks; Backpropagation; Energy consumption; Hebbian theory; Large-scale systems; MOS capacitors; Network-on-a-chip; Neural networks; Neurons;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Networks, 1993. IJCNN '93-Nagoya. Proceedings of 1993 International Joint Conference on
  • Print_ISBN
    0-7803-1421-2
  • Type

    conf

  • DOI
    10.1109/IJCNN.1993.714046
  • Filename
    714046