DocumentCode :
3283664
Title :
Large Temperature Dependence of Negative Differential Conductance in Room-Temperature Operating Silicon Single-Electron/Single-Hole Transistor
Author :
Kobayashi, Masaharu ; Miyaji, Kousuke ; Saitoh, Masumi ; Hiramoto, Toshiro
fYear :
2005
fDate :
Dec. 7-9, 2005
Firstpage :
173
Lastpage :
174
Keywords :
Current measurement; Energy measurement; MOSFET circuits; Quantum dots; Resonant tunneling devices; Silicon; Single electron transistors; Size measurement; Temperature dependence; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Device Research Symposium, 2005 International
Print_ISBN :
1-4244-0083-X
Type :
conf
DOI :
10.1109/ISDRS.2005.1596038
Filename :
1596038
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3283664
بازگشت