Fundamental study of optical probe current sensor using Kerr effect of single magnetic domain film

Author

Sonehara, Makoto ; Otani, Norihisa ; Goto, Tetsu ; Kikuchi, Yutaka ; Sato, Takao ; Yamasawa, Kiyohito ; Miura, Yukiya ; Asanuma, K.

Author_Institution

Spin Device Technol. Center, Shinshu Univ., Nagano, Japan

fYear

2009

fDate

25-28 Oct. 2009

Firstpage

1232

Lastpage

1237

Abstract

An optical probe current sensor using a Kerr effect of an Fe-Si/Mn-Ir exchange-coupled film has been investigated. The optical sensing technique has the advantage of no induced noise from the external electromagnetic interference. In addition, since the proposed method using the Kerr effect of single domain exchange-coupled magnetic thin film utilizes only magnetization rotation, the Barkhausen noise due to a domain wall pinning can be excluded. A fabricated optical probe current sensor consisting of He-Ne laser, Fe-Si/Mn-Ir exchange-coupled film, beam splitter, pin-PD and differential amplifier, exhibited a current sensing bandwidth of 10 kHz and a sensitivity of 2.26 V/A. By using the fabricated optical probe current sensor, the current sensing for PWM inverter motor has been demonstrated.

Keywords

Barkhausen effect; PWM invertors; antiferromagnetic materials; electric current measurement; exchange interactions (electron); ferromagnetic materials; fibre optic sensors; iridium alloys; iron alloys; magnetic domain walls; magnetic thin films; magneto-optical effects; manganese alloys; optical Kerr effect; optical beam splitters; silicon alloys; Barkhausen noise; FeSi-MnIr; Kerr effect; bandwidth 10 kHz; beam splitter; differential amplifier; domain wall pinning; exchange-coupled film; external electromagnetic interference; optical probe current sensor; pin-PD; single magnetic domain film; Electromagnetic interference; Kerr effect; Magnetic domains; Magnetic films; Magnetic sensors; Nonlinear optics; Optical films; Optical noise; Optical sensors; Probes;

fLanguage

English

Publisher

ieee

Conference_Titel

Sensors, 2009 IEEE

Conference_Location

Christchurch

ISSN

1930-0395

Print_ISBN

978-1-4244-4548-6

Electronic_ISBN

1930-0395

Type

conf

DOI

10.1109/ICSENS.2009.5398373

Filename

5398373